MLTSRMSRFID. Machine Learning-Based Test Solutions for Reliable Mixed-Signal/RF Integrated Devices

this project aims to develop test strategies for mixed-signal/radio-frequency (rf) integrated devices using machine learning. the proposed efforts will be directed to two main areas, namely (a) the on-line test of mixed-signal/rf circuits when they are embedded in a system-on-chip (soc) or a system-in-package (sip) that demands high reliability and (b) the testing of rf micro-electro-mechanical systems (mems). the key novelty of this interdisciplinary project lies in the amalgamation of concepts from machine learning with state-of-the-art practices in very large-scale integration (vlsi) design and test, in order to address emerging and open-ended test challenges.