A comparison of surface passivation techniques for measurement of minority carrier lifetime in thin Si wafers: Toward a stable and uniform passivation

Bhushan Sopori, Srinivas Devayajanam, Prakash Basnyat, Vishal Mehta, Helio Moutinho, Bill Nemeth, Vincenzo Lasalvia, Steve Johnston, N. Ravindra, Jeff Binns, Jesse Appel

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