A laboratory technique for the evaluation of electrochemical transparent conductive oxide delamination from glass substrates

A rapid laboratory technique has been developed to evaluate the susceptibility of the transparent conductive oxide (TCO) layer to delaminate from its glass substrate in a thin film PV module. The test sample is stressed through the use of heat, humidity, and a DC bias to drive sodium ions to the TCO-glass interface. Delamination reactions occur at the interface causing the TCO to lose adhesion. The technique takes less than 15 min to complete and is useful in predicting the propensity of a thin film module to fail via electrochemical delamination of the TCO. Potential mechanisms for the adhesion failure are discussed.