A laboratory technique for the evaluation of electrochemical transparent conductive oxide delamination from glass substrates

K. W. Jansen, A. E. Delahoy

Research output: Contribution to journalArticlepeer-review

52 Scopus citations

Abstract

A rapid laboratory technique has been developed to evaluate the susceptibility of the transparent conductive oxide (TCO) layer to delaminate from its glass substrate in a thin film PV module. The test sample is stressed through the use of heat, humidity, and a DC bias to drive sodium ions to the TCO-glass interface. Delamination reactions occur at the interface causing the TCO to lose adhesion. The technique takes less than 15 min to complete and is useful in predicting the propensity of a thin film module to fail via electrochemical delamination of the TCO. Potential mechanisms for the adhesion failure are discussed.

Original languageEnglish (US)
Pages (from-to)153-160
Number of pages8
JournalThin Solid Films
Volume423
Issue number2
DOIs
StatePublished - Jan 15 2003

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Keywords

  • Delamination
  • Electrochemical corrosion
  • Glass
  • Thin-film modules
  • Tin oxide

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