TY - GEN
T1 - A novel pattern classification scheme
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
AU - Xuan, Guorong
AU - Chai, Peiqi
AU - Zhu, Xiuming
AU - Yao, Qiuming
AU - Huang, Cong
AU - Shi, Yun Q.
AU - Fu, Dongdong
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2006
Y1 - 2006
N2 - This paper1 presents a novel pattern classification scheme: Class-wise Non-Principal Component Analysis (CNPCA), which utilizes the distribution characteristics of the samples in each class. The Euclidean distance in the subspace spanned by the eigenvectors associated with smallest eigenvalues in each class, named CNPCA distance, is adopted as the classification criterion. The number of the smallest eigenvalues is selected in such a way that the classification error in a given database is minimized. It is a constant for the database and can be determined by experiment. The CNPCA classification scheme usually outperforms other classification schemes under the situations of high computational complexity (associated with high dimensionality of features and/or calculation of inverse variance matrix) or high classification error rate (e.g., owing to the scattering of between-class being less than that of within-class). The experiments have demonstrated that this method is promising in practical applications.
AB - This paper1 presents a novel pattern classification scheme: Class-wise Non-Principal Component Analysis (CNPCA), which utilizes the distribution characteristics of the samples in each class. The Euclidean distance in the subspace spanned by the eigenvectors associated with smallest eigenvalues in each class, named CNPCA distance, is adopted as the classification criterion. The number of the smallest eigenvalues is selected in such a way that the classification error in a given database is minimized. It is a constant for the database and can be determined by experiment. The CNPCA classification scheme usually outperforms other classification schemes under the situations of high computational complexity (associated with high dimensionality of features and/or calculation of inverse variance matrix) or high classification error rate (e.g., owing to the scattering of between-class being less than that of within-class). The experiments have demonstrated that this method is promising in practical applications.
UR - http://www.scopus.com/inward/record.url?scp=34147161694&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34147161694&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2006.141
DO - 10.1109/ICPR.2006.141
M3 - Conference contribution
AN - SCOPUS:34147161694
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 320
EP - 323
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
Y2 - 20 August 2006 through 24 August 2006
ER -