A theoretical treatment of void electromigration in the strip geometry

M. Ben Amar; L. J. Cummings; G. Richardson

doi:10.1016/S0927-0256(00)00039-2

A theoretical treatment of void electromigration in the strip geometry

M. Ben Amar, L. J. Cummings, G. Richardson

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.

Original language	English (US)
Pages (from-to)	279-289
Number of pages	11
Journal	Computational Materials Science
Volume	17
Issue number	2-4
DOIs	https://doi.org/10.1016/S0927-0256(00)00039-2
State	Published - Jun 2000
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Computer Science
General Chemistry
General Materials Science
Mechanics of Materials
General Physics and Astronomy
Computational Mathematics

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10.1016/S0927-0256(00)00039-2

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@article{b08cf00c19734d40ab48d9f2a7d63d37,

title = "A theoretical treatment of void electromigration in the strip geometry",

abstract = "The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.",

author = "{Ben Amar}, M. and Cummings, {L. J.} and G. Richardson",

year = "2000",

month = jun,

doi = "10.1016/S0927-0256(00)00039-2",

language = "English (US)",

volume = "17",

pages = "279--289",

journal = "Computational Materials Science",

issn = "0927-0256",

publisher = "Elsevier",

number = "2-4",

}

TY - JOUR

T1 - A theoretical treatment of void electromigration in the strip geometry

AU - Ben Amar, M.

AU - Cummings, L. J.

AU - Richardson, G.

PY - 2000/6

Y1 - 2000/6

N2 - The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.

AB - The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.

UR - http://www.scopus.com/inward/record.url?scp=0038413121&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0038413121&partnerID=8YFLogxK

U2 - 10.1016/S0927-0256(00)00039-2

DO - 10.1016/S0927-0256(00)00039-2

M3 - Article

AN - SCOPUS:0038413121

SN - 0927-0256

VL - 17

SP - 279

EP - 289

JO - Computational Materials Science

JF - Computational Materials Science

IS - 2-4

ER -

A theoretical treatment of void electromigration in the strip geometry

Abstract

All Science Journal Classification (ASJC) codes

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