AC Product Defect Level and Yield Loss

Jacob Savir

doi:10.1109/66.61969

AC Product Defect Level and Yield Loss

Jacob Savir

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The ac defect level and yield loss after test for both logic and random-access memory (RAM) semiconductor chips is considered. Computation of chip ac defect level and yield loss, after test, is dependent upon the availability of statistical information regarding the behavior of the chip's delay and of the tester error. This statistical information can either be derived from manufacturing process parameters, or measured by a tester. Both the tester accuracy and the test coverage in computing the ac defect level and yield loss is taken into account.

Original language	English (US)
Pages (from-to)	195-205
Number of pages	11
Journal	IEEE Transactions on Semiconductor Manufacturing
Volume	3
Issue number	4
DOIs	https://doi.org/10.1109/66.61969
State	Published - Nov 1990
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Keywords

Chip defect level
ac test
chip yield
dc test
probability density function
propagation delay

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10.1109/66.61969

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AB - The ac defect level and yield loss after test for both logic and random-access memory (RAM) semiconductor chips is considered. Computation of chip ac defect level and yield loss, after test, is dependent upon the availability of statistical information regarding the behavior of the chip's delay and of the tester error. This statistical information can either be derived from manufacturing process parameters, or measured by a tester. Both the tester accuracy and the test coverage in computing the ac defect level and yield loss is taken into account.

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KW - chip yield

KW - dc test

KW - probability density function

KW - propagation delay

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AC Product Defect Level and Yield Loss

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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