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AC Product Defect Level and Yield Loss
Jacob Savir
Research output
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Article
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peer-review
5
Scopus citations
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Dive into the research topics of 'AC Product Defect Level and Yield Loss'. Together they form a unique fingerprint.
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Keyphrases
Defect Levels
100%
Manufacturing Process Parameters
25%
Product Defects
100%
Random Access Memory
25%
Semiconductor chips
25%
Statistical Information
50%
Test Coverage
25%
Yield Loss
100%
Engineering
Defects
100%
Manufacturing Process
25%
Process Parameter
25%
Random Access Memory
25%