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AC product defect level and yield loss
Jacob Savir
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
3
Scopus citations
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Dive into the research topics of 'AC product defect level and yield loss'. Together they form a unique fingerprint.
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Keyphrases
Yield Loss
100%
Defect Levels
100%
Product Defects
100%
Statistical Information
50%
Semiconductor chips
25%
Random Access Memory
25%
Manufacturing Process Parameters
25%
General Affect
25%
Engineering
Defects
100%
Manufacturing Process
25%
Random Access Memory
25%
Process Parameter
25%