Algorithm-based fault detection of analog linear time-invariant circuits

Z. Guo, J. Savir

Research output: Contribution to conferencePaperpeer-review

3 Scopus citations

Abstract

Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.

Original languageEnglish (US)
Pages49-54
Number of pages6
StatePublished - Jan 1 2001
Event18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics - Budapest, Hungary
Duration: May 21 2001May 23 2001

Other

Other18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics
CountryHungary
CityBudapest
Period5/21/015/23/01

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Keywords

  • Analog circuit
  • Fault detection
  • State space method

Fingerprint Dive into the research topics of 'Algorithm-based fault detection of analog linear time-invariant circuits'. Together they form a unique fingerprint.

Cite this