Algorithm-based fault detection of analog linear time-invariant circuits

Z. Guo; J. Savir

Algorithm-based fault detection of analog linear time-invariant circuits

Z. Guo, J. Savir

Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.

Original language	English (US)
Pages	49-54
Number of pages	6
State	Published - 2001
Event	18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics - Budapest, Hungary Duration: May 21 2001 → May 23 2001

Other

Other	18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics
Country/Territory	Hungary
City	Budapest
Period	5/21/01 → 5/23/01

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Keywords

Analog circuit
Fault detection
State space method

Cite this

@conference{f162ac7cca314598a2ab995a1924583a,

title = "Algorithm-based fault detection of analog linear time-invariant circuits",

abstract = "Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.",

keywords = "Analog circuit, Fault detection, State space method",

author = "Z. Guo and J. Savir",

year = "2001",

language = "English (US)",

pages = "49--54",

note = "18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics ; Conference date: 21-05-2001 Through 23-05-2001",

}

TY - CONF

T1 - Algorithm-based fault detection of analog linear time-invariant circuits

AU - Guo, Z.

AU - Savir, J.

PY - 2001

Y1 - 2001

N2 - Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.

AB - Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.

KW - Analog circuit

KW - Fault detection

KW - State space method

UR - https://www.scopus.com/pages/publications/0034822501

UR - https://www.scopus.com/inward/citedby.url?scp=0034822501&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0034822501

SP - 49

EP - 54

T2 - 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics

Y2 - 21 May 2001 through 23 May 2001

ER -

Algorithm-based fault detection of analog linear time-invariant circuits

Abstract

Other

All Science Journal Classification (ASJC) codes

Keywords

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