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Algorithm-based fault detection of analog linear time-invariant circuits
Z. Guo,
J. Savir
Electrical and Computer Engineering
Research output
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Contribution to conference
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Paper
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peer-review
3
Scopus citations
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Dive into the research topics of 'Algorithm-based fault detection of analog linear time-invariant circuits'. Together they form a unique fingerprint.
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Keyphrases
Fault Detection
100%
Linear Time Invariant
100%
Testing Method
50%
Small Circuits
50%
Parametric Faults
50%
Tolerance Value
50%
Output Value
50%
Engineering
Linear Time Invariant
100%
Fits and Tolerances
50%
Conducted Experiment
50%
Output Value
50%
Computer Science
Test Methodology
100%
Fault Detection
100%