Ambipolar diffusion length in a-Si:H(F) and a-Si,Ge:H,F measured with the steady-state photocarrier grating technique

J. Z. Liu, X. Li, P. Roca i Cabarrocas, J. P. Conde, A. Maruyama, H. Park, S. Wagner, A. E. Delahoy

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

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