Ambipolar diffusion length in a-Si:H(F) and a-Si,Ge:H,F measured with the steady-state photocarrier grating technique

  • J. Z. Liu
  • , X. Li
  • , P. Roca i Cabarrocas
  • , J. P. Conde
  • , A. Maruyama
  • , H. Park
  • , S. Wagner
  • , A. E. Delahoy

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

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