Skip to main navigation
Skip to search
Skip to main content
New Jersey Institute of Technology Home
Help & FAQ
Home
Profiles
Research units
Facilities
Federal Grants
Research output
Press/Media
Search by expertise, name or affiliation
An accurate ellipsometric reflectance ratio method
O. L. Russo
Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
2
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'An accurate ellipsometric reflectance ratio method'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Reflectance Ratio
100%
Ratio Method
100%
One-part
50%
Source Intensity
50%
Reflectance Measurement
50%
Source Variation
50%
Absolute Reflectance
50%
Reflected Beam
50%
Engineering
Reflectance
100%
Source Intensity
16%
Reflectance Measurement
16%
Reflected Beam
16%
Earth and Planetary Sciences
Reflectance
100%