TY - GEN
T1 - An experimental study of small world network model for wireless networks
AU - Dong, Ziqian
AU - Wang, Zheng
AU - Xie, Wen
AU - Emelumadu, Obinna
AU - Lin, Chuanbi
AU - Rojas-Cessa, Roberto
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/10
Y1 - 2015/11/10
N2 - The concept of small world phenomenon has been observed and applied in many types of networks. This paper evaluates two small-world network models in clustering formation and routing in wireless network. We present simulation of two small world network models, Watts and Stragtz's (WS) and the Newman and Watts (NW) models and evaluate average node degree and path length. We create a test wireless network using standard routing protocols in OPNET to validate the small world phenomenon, evaluate its performance and present research challenges of applying these models for wireless networks. This study provides insights on how wireless networks behave under small world network models with distributed routing protocols.
AB - The concept of small world phenomenon has been observed and applied in many types of networks. This paper evaluates two small-world network models in clustering formation and routing in wireless network. We present simulation of two small world network models, Watts and Stragtz's (WS) and the Newman and Watts (NW) models and evaluate average node degree and path length. We create a test wireless network using standard routing protocols in OPNET to validate the small world phenomenon, evaluate its performance and present research challenges of applying these models for wireless networks. This study provides insights on how wireless networks behave under small world network models with distributed routing protocols.
UR - http://www.scopus.com/inward/record.url?scp=84969535023&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84969535023&partnerID=8YFLogxK
U2 - 10.1109/SARNOF.2015.7324646
DO - 10.1109/SARNOF.2015.7324646
M3 - Conference contribution
AN - SCOPUS:84969535023
T3 - 2015 36th IEEE Sarnoff Symposium
SP - 70
EP - 75
BT - 2015 36th IEEE Sarnoff Symposium
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 36th IEEE Sarnoff Symposium, Sarnoff 2015
Y2 - 20 September 2015 through 22 September 2015
ER -