@inproceedings{aeba591b5adf4ba995ba0d77cdd0ce07,
title = "An On-Chip Learning Accelerator for Spiking Neural Networks using STT-RAM Crossbar Arrays",
abstract = "In this work, we present a scheme for implementing learning on a digital non-volatile memory (NVM) based hardware accelerator for Spiking Neural Networks (SNNs). Our design estimates across three prominent non-volatile memories - Phase Change Memory (PCM), Resistive RAM (RRAM), and Spin Transfer Torque RAM (STT-RAM) show that the STT-RAM arrays enable at least 2× higher throughput compared to the other two memory technologies. We discuss the design and the signal communication framework through the STT-RAM crossbar array for training and inference in SNNs. Each STT-RAM cell in the array stores a single bit value. Our neurosynaptic computational core consists of the memory crossbar array and its read/write peripheral circuitry and the digital logic for the spiking neurons, weight update computations, spike router, and decoder for incoming spike packets. Our STT-RAM based design shows ~20× higher performance per unit Watt per unit area compared to conventional SRAM based design, making it a promising learning platform for realizing systems with significant area and power limitations.",
keywords = "Neuromorphic hardware, STT-RAM, Spiking Neural Networks, crossbar arrays",
author = "Kulkarni, {Shruti R.} and Shihui Yin and Seo, {Jae Sun} and Bipin Rajendran",
note = "Publisher Copyright: {\textcopyright} 2020 EDAA.; 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 ; Conference date: 09-03-2020 Through 13-03-2020",
year = "2020",
month = mar,
doi = "10.23919/DATE48585.2020.9116226",
language = "English (US)",
series = "Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1019--1024",
editor = "{Di Natale}, Giorgio and Cristiana Bolchini and Elena-Ioana Vatajelu",
booktitle = "Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020",
address = "United States",
}