Analog Circuit Test Using Transfer Function Coefficient Estimates

Zhen Guo, Jacob Savir

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.

Original languageEnglish (US)
Pages (from-to)642-646
Number of pages5
JournalIEICE Transactions on Information and Systems
VolumeE87-D
Issue number3
StatePublished - Mar 2004

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

Keywords

  • Fault detection
  • Monte-Carlo simulation
  • Parametric faults
  • System identification

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