Analog Circuit Test using Transfer Function Coefficient Estimates

Zhen Guo, Jacob Savir

Research output: Contribution to journalConference articlepeer-review

17 Scopus citations

Abstract

An account of the analog circuit testing method based on estimating the transfer function coefficients was presented. The coefficient-based test (CBT) method was employed for detecting parametric fault in analog circuits. The method used Monte-Carlo simulation and system identification tools for determining the faults in a given circuit under test (CUT).

Original languageEnglish (US)
Pages (from-to)1155-1163
Number of pages9
JournalIEEE International Test Conference (TC)
StatePublished - Nov 6 2003
EventProceedings International Test Conference 2003 - Charlotte, NC, United States
Duration: Sep 30 2003Oct 2 2003

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Keywords

  • Fault detection
  • Monte-Carlo simulation
  • Parametric faults
  • System identification

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