Abstract
An account of the analog circuit testing method based on estimating the transfer function coefficients was presented. The coefficient-based test (CBT) method was employed for detecting parametric fault in analog circuits. The method used Monte-Carlo simulation and system identification tools for determining the faults in a given circuit under test (CUT).
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1155-1163 |
| Number of pages | 9 |
| Journal | IEEE International Test Conference (TC) |
| State | Published - 2003 |
| Event | Proceedings International Test Conference 2003 - Charlotte, NC, United States Duration: Sep 30 2003 → Oct 2 2003 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Applied Mathematics
Keywords
- Fault detection
- Monte-Carlo simulation
- Parametric faults
- System identification