Analysis of alloying and built-in voltage in thin film chalcogenide solar cells using modulation spectroscopy

Alan E. Delahoy, Zimeng Cheng, Jingong Pan, Shou Peng, Ken K. Chin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Modulation spectroscopy has been performed on superstrate CdS/CdTe solar cells prepared by close-spaced sublimation. Photoreflectance (PR) measurements were conducted near the CdTe E0 band edge using a variable-wavelength probe beam in conjunction with a chopped pump beam. A fit to the observed PR spectrum was made using two third-derivative, low-field lineshapes. The band gap of the active material near the junction is 1.46 eV (CdTe1-xSx). The envelope function varied as 1 - V/Vbi· The PR spectrum shifted with a temperature coefficient of -0.31 meV/K. Photoreflectance spectroscopy offers a powerful method of determining absorber band gaps, alloying, and built-in voltage in thin-film solar cells.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Publication series

Name2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Keywords

  • CdTe
  • chalcogenide
  • photoreflectance
  • solar cell
  • spectroscopy
  • thin film

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