Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
- Utkur Mirsaidov
- , Serge F. Timashev
- , Yuriy S. Polyakov
- , Pavel I. Misurkin
- , Ibrahim Musaev
- , Sergey V. Polyakov
Research output: Contribution to journal › Article › peer-review
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