Applications of spectral emissometry

Nuggehalli M. Ravindra, Krshna N. Ravindra, Markus Rabus, Vishal R. Mehta, Stephen E. Rubin, Sudhakar Shet, Anthony T. Fiory

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Applications of spectral emissometry for measurements of radiative properties of erbium oxide and quartz have been described. The spectral emissometer has also been utilized to characterize the optical properties of infrared filters. These measurements have been performed in the wavelength range of 1 to 20 microns and temperature range of 25 to 1000°C. The measured properties of erbium oxide and quartz have been compared with available optical properties in the literature. Simulation of the radiative properties of quartz has been made utilizing Multi-Rad, a PC-based software implemented in the form of the matrix method of multilayers. The relevance of these measurements has been discussed in light of thermophotovoltaics and multi-wavelength imaging pyrometry.

Original languageEnglish (US)
Title of host publicationMaterials Science and Technology 2005 - Proceedings of the Conference
Pages49-59
Number of pages11
StatePublished - Dec 1 2005
EventMaterials Science and Technology 2005 Conference - Pittsburgh, PA, United States
Duration: Sep 25 2005Sep 28 2005

Publication series

NameMaterials Science and Technology
Volume4
ISSN (Print)1546-2498

Other

OtherMaterials Science and Technology 2005 Conference
CountryUnited States
CityPittsburgh, PA
Period9/25/059/28/05

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Keywords

  • Emissivity
  • Erbium oxide
  • Infrared filters
  • Quartz
  • Radiative properties
  • Thermophotovoltaics

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