TY - GEN
T1 - Arbitrary-order iterative learning control considering H∞ synthesis
AU - Zheng, Minghui
AU - Wang, Cong
AU - Sun, Liting
AU - Tomizuka, Masayoshi
N1 - Publisher Copyright:
Copyright © 2016 by ASME.
PY - 2016
Y1 - 2016
N2 - Iterative learning control (ILC) is an effective technique to improve the tracking performance of systems through adjusting the feedforward control signal based on the memory data. It is critically important to design the learning filters in the ILC algorithm that assures the robust stability of the convergence of tracking errors from one iteration to next. The design procedure usually involves lots of tuning work especially in highorder ILC. To facilitate this procedure, this paper proposes an approach to design learning filters for an arbitrary-order ILC with guaranteed convergence and ease of tuning. The filter design problem is formulated into an H∞ optimal control problem. This approach is based on an infinite impulse response (IIR) system and conducted directly in iteration-frequency domain. Important characteristics of the proposed approach are explored and demonstrated on a simulated wafer scanning system.
AB - Iterative learning control (ILC) is an effective technique to improve the tracking performance of systems through adjusting the feedforward control signal based on the memory data. It is critically important to design the learning filters in the ILC algorithm that assures the robust stability of the convergence of tracking errors from one iteration to next. The design procedure usually involves lots of tuning work especially in highorder ILC. To facilitate this procedure, this paper proposes an approach to design learning filters for an arbitrary-order ILC with guaranteed convergence and ease of tuning. The filter design problem is formulated into an H∞ optimal control problem. This approach is based on an infinite impulse response (IIR) system and conducted directly in iteration-frequency domain. Important characteristics of the proposed approach are explored and demonstrated on a simulated wafer scanning system.
UR - http://www.scopus.com/inward/record.url?scp=85015700359&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85015700359&partnerID=8YFLogxK
U2 - 10.1115/DSCC2016-9902
DO - 10.1115/DSCC2016-9902
M3 - Conference contribution
AN - SCOPUS:85015700359
T3 - ASME 2016 Dynamic Systems and Control Conference, DSCC 2016
BT - Mechatronics; Mechatronics and Controls in Advanced Manufacturing; Modeling and Control of Automotive Systems and Combustion Engines; Modeling and Validation; Motion and Vibration Control Applications; Multi-Agent and Networked Systems; Path Planning and Motion Control; Robot Manipulators; Sensors and Actuators; Tracking Control Systems; Uncertain Systems and Robustness; Unmanned, Ground and Surface Robotics; Vehicle Dynamic Controls; Vehicle Dynamics and Traffic Control
PB - American Society of Mechanical Engineers
T2 - ASME 2016 Dynamic Systems and Control Conference, DSCC 2016
Y2 - 12 October 2016 through 14 October 2016
ER -