At-speed test is not necessarily an AC test

Jacob Savir, Robert Berry

Research output: Contribution to journalConference articlepeer-review

24 Scopus citations


A measure for assessing how well a given generator can apply AC patterns to the logic it is intended to drive is proposed. It is shown that this measure, called the AC strength, is both easily computable and gives a direct indication as to how good the generator is in performing its AC test task. Also proposed is an alternative to the special latch design for AC test. This alternative uses normal LSSD (level sensitive scan design) latch design, and pays special attention to the way the circuit inputs are connected along the scan chain. It is shown that by connecting the inputs in a special way, the AC test potential is greatly enhanced, and the hardware overhead, in most cases, will be negligible.

Original languageEnglish (US)
Pages (from-to)722-728
Number of pages7
JournalDigest of Papers - International Test Conference
StatePublished - Jan 1992
Externally publishedYes
EventProceedings of the International Test Conference 1991 - Nashville, TN, USA
Duration: Oct 26 1991Oct 30 1991

All Science Journal Classification (ASJC) codes

  • General Engineering


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