Auger, ellipsometry, and environmental studies of thin films applied to schottky (MIS) solar cells

Physics & Astronomy

• MIS (semiconductors) 66%
• ellipsometry 57%
• dirt 45%
• degradation 44%
• discoloration 44%
• solar cells 43%
• ellipsometers 37%
• thermal stresses 31%
• silicon oxides 31%
• electronics 30%
• metal films 30%
• thin films 30%
• polystyrene 26%
• heat treatment 23%
• wire 22%
• insulators 21%
• coatings 19%
• cycles 19%
• oxides 18%
• profiles 16%
• electric potential 15%
• cells 15%
• metals 15%
• performance 13%

Engineering & Materials Science

• Ellipsometry 100%
• Management information systems 73%
• Solar cells 62%
• Thin films 55%
• Electronic properties 45%
• Discoloration 44%
• Silicon oxides 42%
• Degradation 41%
• Metals 37%
• Polystyrenes 34%
• Encapsulation 33%
• Thermal stress 29%
• Heat treatment 25%
• Oxides 25%
• Wire 22%
• Coatings 22%
• Electric potential 15%

Chemical Compounds

• Ellipsometry 64%
• Solar Cell 51%
• Silicon Oxide 36%
• Nonconductor 33%
• Decolorization 30%
• Metal 26%
• Encapsulation 25%
• Heat Treatment 24%
• Electronic Property 24%
• Voltage 21%
• Diffusion 18%
• Coating Agent 17%
• Oxide 16%
• Liquid Film 14%