BIST-based fault diagnosis in the presence of embedded memories

Keyphrases

• Fault Diagnosis 100%
• Embedded Memory 100%
• Generation Method 50%
• Diagnostic Challenge 50%
• Fault Simulation 50%
• Table-driven 50%
• Special Techniques 50%
• Fault-free 50%
• Test Case Generation 50%
• Event Table 50%
• Memory Address 50%
• Memory Control 50%

Computer Science

• embedded memory 100%
• Fault Diagnosis 100%
• Fault Simulation 50%