BIST pretest of ICs: Risks and benefits

Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Fingerprint

Dive into the research topics of 'BIST pretest of ICs: Risks and benefits'. Together they form a unique fingerprint.

Engineering & Materials Science