Bridging the gap

Lori Watrous-deVersterre

Bridging the gap

Lori Watrous-deVersterre

Research output: Contribution to journal › Conference article › peer-review

Abstract

The implications of design on the economics of the production value chain are addressed as the most significant impact resulting from complex system-on-chip (SOC) designs. It is suggested that design-for-test (DFT) possess ability to integrate with EDA design tools to assure better testable designs with reusable components and better productivity. From the design and production viewpoints, DFT shows the advantage to tailor flexible, cost-effective solutions for both design and production industries.

Original language	English (US)
Pages (from-to)	27
Number of pages	1
Journal	IEEE International Test Conference (TC)
State	Published - 2001
Externally published	Yes
Event	International Test Conference 2001 Proceedings - Baltimore, MD, United States Duration: Oct 30 2001 → Nov 1 2001

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Applied Mathematics

Cite this

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title = "Bridging the gap",

abstract = "The implications of design on the economics of the production value chain are addressed as the most significant impact resulting from complex system-on-chip (SOC) designs. It is suggested that design-for-test (DFT) possess ability to integrate with EDA design tools to assure better testable designs with reusable components and better productivity. From the design and production viewpoints, DFT shows the advantage to tailor flexible, cost-effective solutions for both design and production industries.",

author = "Lori Watrous-deVersterre",

year = "2001",

language = "English (US)",

pages = "27",

journal = "IEEE International Test Conference (TC)",

issn = "1089-3539",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "International Test Conference 2001 Proceedings ; Conference date: 30-10-2001 Through 01-11-2001",

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AB - The implications of design on the economics of the production value chain are addressed as the most significant impact resulting from complex system-on-chip (SOC) designs. It is suggested that design-for-test (DFT) possess ability to integrate with EDA design tools to assure better testable designs with reusable components and better productivity. From the design and production viewpoints, DFT shows the advantage to tailor flexible, cost-effective solutions for both design and production industries.

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M3 - Conference article

AN - SCOPUS:0035684572

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T2 - International Test Conference 2001 Proceedings

Y2 - 30 October 2001 through 1 November 2001

ER -

Bridging the gap

Abstract

All Science Journal Classification (ASJC) codes

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