Bridging the gap

Research output: Contribution to journalConference articlepeer-review

Abstract

The implications of design on the economics of the production value chain are addressed as the most significant impact resulting from complex system-on-chip (SOC) designs. It is suggested that design-for-test (DFT) possess ability to integrate with EDA design tools to assure better testable designs with reusable components and better productivity. From the design and production viewpoints, DFT shows the advantage to tailor flexible, cost-effective solutions for both design and production industries.

Original languageEnglish (US)
Number of pages1
JournalIEEE International Test Conference (TC)
StatePublished - Dec 1 2001
Externally publishedYes
EventInternational Test Conference 2001 Proceedings - Baltimore, MD, United States
Duration: Oct 30 2001Nov 1 2001

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

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