BUILT-IN CHECKING OF THE CORRECT SELF-TEST SIGNATURE.

W. H. McAnney; J. Savir

BUILT-IN CHECKING OF THE CORRECT SELF-TEST SIGNATURE.

W. H. McAnney, J. Savir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, say all zeros. In this way it is possible to determine if a fault has been detected by OR-ing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test.

Original language	English (US)
Title of host publication	Digest of Papers - International Test Conference
Publisher	IEEE
Pages	54-58
Number of pages	5
ISBN (Print)	0818607262
State	Published - 1986
Externally published	Yes

Publication series

Name	Digest of Papers - International Test Conference
ISSN (Print)	0743-1686

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

@inproceedings{78cb46400c654dfba5a0f0d45ba11711,

title = "BUILT-IN CHECKING OF THE CORRECT SELF-TEST SIGNATURE.",

abstract = "A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, say all zeros. In this way it is possible to determine if a fault has been detected by OR-ing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test.",

author = "McAnney, {W. H.} and J. Savir",

year = "1986",

language = "English (US)",

isbn = "0818607262",

series = "Digest of Papers - International Test Conference",

publisher = "IEEE",

pages = "54--58",

booktitle = "Digest of Papers - International Test Conference",

}

TY - GEN

T1 - BUILT-IN CHECKING OF THE CORRECT SELF-TEST SIGNATURE.

AU - McAnney, W. H.

AU - Savir, J.

PY - 1986

Y1 - 1986

N2 - A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, say all zeros. In this way it is possible to determine if a fault has been detected by OR-ing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test.

AB - A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, say all zeros. In this way it is possible to determine if a fault has been detected by OR-ing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test.

UR - http://www.scopus.com/inward/record.url?scp=0022920332&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022920332&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0022920332

SN - 0818607262

T3 - Digest of Papers - International Test Conference

SP - 54

EP - 58

BT - Digest of Papers - International Test Conference

PB - IEEE

ER -

BUILT-IN CHECKING OF THE CORRECT SELF-TEST SIGNATURE.

Abstract

Publication series

All Science Journal Classification (ASJC) codes

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