Built-in Self-Test: Milestones and Challenges

Jacob Savir, Paul H. Bardell

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

: This paper describes the progress in built-in self-test (BIST) since its inception, and the important problems that still need to be solved to make the technique widely acceptable. The paper includes a reference list and an extensive bibliography on the subject matter.

Original languageEnglish (US)
Pages (from-to)23-44
Number of pages22
JournalVLSI Design
Volume1
Issue number1
DOIs
StatePublished - 1993
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Keywords

  • BIST
  • Detection probability
  • Exhaustive test
  • Fault simulation
  • Random test
  • Signal probability
  • Signature analysis
  • Test generation
  • Weighted random test

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