Abstract
: This paper describes the progress in built-in self-test (BIST) since its inception, and the important problems that still need to be solved to make the technique widely acceptable. The paper includes a reference list and an extensive bibliography on the subject matter.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 23-44 |
| Number of pages | 22 |
| Journal | VLSI Design |
| Volume | 1 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1993 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
Keywords
- BIST
- Detection probability
- Exhaustive test
- Fault simulation
- Random test
- Signal probability
- Signature analysis
- Test generation
- Weighted random test