Abstract
A theoretical model has been developed for the plasmon excitation spectrum and the response of an electron energy-loss spectrometer. These theoretical functions have been convoluted under various conditions in order to simulate a range of actual experimental conditions. The results predict the quantitative effects of instrument response on the plasmon spectrum. These results are related to the error associated with sample thickness determinations by using the ratios of the areas under the plasmon spectrum. It is concluded that this method for calculating the sample thickness can introduce large errors ( greater than 30%) when the samle is very thin ( less than 100 A) and the resolution of the spectrometer and the separation of the plasmon peaks are not at optimum values.
| Original language | English (US) |
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| Pages | 141-144 |
| Number of pages | 4 |
| State | Published - 1979 |
| Externally published | Yes |
| Event | Proc Annu Conf Microbeam Anal Soc 14th - San Antonio, Tex Duration: Aug 12 1979 → Aug 17 1979 |
Conference
| Conference | Proc Annu Conf Microbeam Anal Soc 14th |
|---|---|
| City | San Antonio, Tex |
| Period | 8/12/79 → 8/17/79 |
All Science Journal Classification (ASJC) codes
- General Engineering