Carrier transport mechanisms in metal-insulator-metal Au/Ba _0.8Sr_0.2TiO₃/ ZrO₂/ Ba _0.8Sr_0.2TiO₃/Pt thin film heterostructures

Keyphrases

• Field Regions 100%
• Carrier Transport Mechanism 100%
• Zirconium Dioxide 100%
• Metal-insulator-metal 100%
• Thin Film Heterostructure 100%
• Pt Thin Film 100%
• Conduction Process 75%
• Heterostructure 50%
• Leakage Current 50%
• Ohmic Conduction 50%
• Current Mechanism 50%
• Space Charge Limited Current 50%
• Leakage Mechanism 50%
• Temperature Range 25%
• Dielectric 25%
• Si Substrate 25%
• High Field 25%
• Silica 25%
• Conduction Current 25%
• Level Energies 25%
• Low Field 25%
• Trap Level 25%
• Activation Energy 25%
• Poole-Frenkel Mechanism 25%
• Shallow Traps 25%
• Deep Traps 25%
• Ba0.8Sr0.2TiO3 25%
• Energy Band Diagram 25%
• Electrical Conduction Mechanism 25%
• Medium Field 25%
• Multilayer Thin Films 25%
• Sol-gel Process 25%
• Metal-insulator-metal Devices 25%
• I-V Measurement 25%

Engineering

• Transport Mechanism 100%
• Thin Films 100%
• Heterostructures 100%
• Field Region 100%
• Metal-Insulator-Metal 100%
• Ohmic Conduction 50%
• Space Charge 50%
• Shallower 25%
• Dielectrics 25%
• Temperature Range 25%
• Si Substrate 25%
• Activation Energy 25%
• Level Energy 25%
• Sol-Gel Process 25%
• Energy Band Diagram 25%

Material Science

• Thin Films 100%
• Carrier Transport 100%
• Heterojunction 100%
• Zirconia 100%
• Dielectric Material 25%
• Sol-Gel 25%
• Activation Energy 25%