Abstract
Cavity-enhanced optical Hall effect at terahertz (THz) frequencies is employed to determine the free charge carrier properties in epitaxial graphene (EG) with different number of layers grown by high-temperature sublimation on 4H-SiC(0001). We find that one monolayer (ML) EG possesses p-type conductivity with a free hole concentration in the low 10 12 cm −2 range and a free hole mobility parameter as high as 1550 cm 2 /Vs. We also find that 6 ML EG shows n-type doping behavior with a much lower free electron mobility parameter of 470 cm 2 /Vs and an order of magnitude higher free electron density in the low 10 13 cm −2 range. The observed differences are discussed. The cavity-enhanced THz optical Hall effect is demonstrated to be an excellent tool for contactless access to the type of free charge carriers and their properties in two-dimensional materials such as EG.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 357-360 |
| Number of pages | 4 |
| Journal | Applied Surface Science |
| Volume | 421 |
| DOIs | |
| State | Published - Nov 1 2017 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
Keywords
- Epitaxial graphene
- Free charge carrier properties
- THz optical Hall effect