Characteristic evaluation of a near-infrared Fabry-Pérot filter for the InfraRed Imaging Magnetograph (IRIM)

Wenda Cao, C. Denker, Haimin Wang, J. Ma, M. Qu, J. Wang, P. R. Goode

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations

Abstract

The InfraRed Imaging Magnetograph (TRIM) is a high temporal resolution, high spatial resolution, high spectral resolving power, and high magnetic sensitivity solar two-dimensional narrow-band spectro-polarimeter working in the near infrared from 1.0 μm to 1.7 μm at Big Bear Solar Observatory (BBSO). It consists of an interference filter, a polarization analyzer, a birefringent filter, and a Fabry-Pérot etalon. As the narrowest filter of IRIM. the infrared Fabry-Pérot plays a very important role in achieving the narrow band transmission of ∼ 10 pm and high throughput between 85% and 95% for the full wavelength range, maintaining wavelength tuning ability from 1.0 to 1.7 μm, and assuring stability and reliability. As the third of a series of publications describing IRIM, this paper outlines a set of methods to evaluate the near infrared Fabry-Pérot etalon. Two-dimensional characteristic maps of the near infrared Fabry-Pérot etalon, including the bandpass Δλ, effective finesse F eff, peak transmission τ max, along with free spectral range, flatness, roughness, and stability and repeatability were obtained with laboratory equipment. These measured results will benefit the optimization of IRIM design and observational mode of the future.

Original languageEnglish (US)
Pages (from-to)307-315
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5171
DOIs
StatePublished - May 3 2004
EventTelescopes and Instrumentation for Solar Astrophysics - San Diego, CA, United States
Duration: Aug 7 2003Aug 8 2003

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Birefringent filter
  • Fabry-Pérot etalon
  • Finesse
  • Imaging interferometry
  • Near-infrared

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