Characterization and visualization of sophisticated scanning attacks

Maggie Cheng, Quanmin Ye, Robert F. Erbacher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Detection of sophisticated stealthy network scans requires analyzing large amounts of network data collected over long periods of time. The sheer volume of the data prohibits efficient detection from a pure algorithmic approach. However timely detection of such sophisticated scanning attacks is critical since the attacker employing these approaches is usually well-resourced and potentially can bring high impact to the network than a naive attacker can. To detect such sophisticated scans we propose the integration of algorithmic detection and visualization for human detection to simultaneously optimize computational complexity and human analyst time. The proposed approach provides real world detection capabilities without excessive computation overhead. We characterize the features of scanning attacks in a graph theory context, propose efficient graph algorithms to extract these features in real time, employ visualization techniques to show the relevant multidimensional characteristics, and provide test scenarios to show that the proposed work is more efficient and effective than previous approaches.

Original languageEnglish (US)
Title of host publication2013 IEEE International Conference on Communications, ICC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2047-2051
Number of pages5
ISBN (Print)9781467331227
DOIs
StatePublished - Jan 1 2013
Event2013 IEEE International Conference on Communications, ICC 2013 - Budapest, Hungary
Duration: Jun 9 2013Jun 13 2013

Publication series

NameIEEE International Conference on Communications
ISSN (Print)1550-3607

Other

Other2013 IEEE International Conference on Communications, ICC 2013
CountryHungary
CityBudapest
Period6/9/136/13/13

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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