Charge trapping in high-Κ gate dielectrics: A recent understanding

D. Misra, N. A. Chowdhury

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Fingerprint

Dive into the research topics of 'Charge trapping in high-Κ gate dielectrics: A recent understanding'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Earth and Planetary Sciences

Immunology and Microbiology