Charge trapping in ultrathin hafnium silicate/metal gate stacks

P. Srinivasan, N. A. Chowdhury, D. Misra

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Fingerprint

Dive into the research topics of 'Charge trapping in ultrathin hafnium silicate/metal gate stacks'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds