Coefficient-based test of parametric faults in analog circuits

Zhen Guo, Jacob Savir

Research output: Contribution to conferencePaperpeer-review

Abstract

A coefficient-based test of parametric faults in analog circuits was discussed. The method was found to use pseudo Monte-Carlo simulation and system identification tools for determination of fault in given circuit under test (CUT). The analysis showed that the estimated time response and frequency and phase responses were close to the computed ones.

Original languageEnglish (US)
Pages71-75
Number of pages5
StatePublished - Jul 11 2003
EventProceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States
Duration: May 20 2003May 22 2003

Other

OtherProceedings of the 20th IEEE Information and Measurement Technology Conference
CountryUnited States
CityVail, CO
Period5/20/035/22/03

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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