Abstract
A coefficient-based test of parametric faults in analog circuits was discussed. The method was found to use pseudo Monte-Carlo simulation and system identification tools for determination of fault in given circuit under test (CUT). The analysis showed that the estimated time response and frequency and phase responses were close to the computed ones.
| Original language | English (US) |
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| Pages | 71-75 |
| Number of pages | 5 |
| State | Published - 2003 |
| Event | Proceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States Duration: May 20 2003 → May 22 2003 |
Other
| Other | Proceedings of the 20th IEEE Information and Measurement Technology Conference |
|---|---|
| Country/Territory | United States |
| City | Vail, CO |
| Period | 5/20/03 → 5/22/03 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering