Coefficient-based test of parametric faults in analog circuits

Zhen Guo, Jacob Savir

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte Carlo simulation and system-identification tools to determine whether a given circuit under test (CUT) is faulty. From the circuit description, and component tolerance specifications, the tolerance boxes of all circuit transfer-function coefficients are precomputed and used during the test. Using input/output signal information, the test procedure attempts to extract the CUT's transfer function. When this extraction is complete - if one or more of these measured transfer-function coefficients are found to be outside their tolerance boxes-the circuit is declared faulty.

Original languageEnglish (US)
Pages (from-to)150-157
Number of pages8
JournalIEEE Transactions on Instrumentation and Measurement
Volume55
Issue number1
DOIs
StatePublished - Feb 1 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

Keywords

  • Fault detection
  • Monte Carlo simulation
  • Parameter tolerance
  • Parametric faults
  • System identification

Fingerprint Dive into the research topics of 'Coefficient-based test of parametric faults in analog circuits'. Together they form a unique fingerprint.

Cite this