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Coefficient-based test of parametric faults in analog circuits
Zhen Guo,
Jacob Savir
Electrical and Computer Engineering
Research output
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Contribution to journal
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peer-review
54
Scopus citations
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Keyphrases
Analog Circuits
100%
Parametric Faults
100%
Transfer Function Coefficients
100%
Output Signal
50%
Input-output
50%
Monte Carlo Simulation
50%
Circuit Component
50%
Transfer Function
50%
Circuit Testing
50%
System Identification Toolbox
50%
Circuit Description
50%
Signal Information
50%
Tolerance Specification
50%
Component Tolerance
50%
Engineering
Analog Circuit
100%
Transfer Function
100%
Fits and Tolerances
66%
Test Procedure
33%
Output Signal
33%
Component Tolerance
33%
Computer Science
Analog Circuit
100%
Transfer Function
100%
Input/Output
33%
System Identification
33%
Monte Carlo Simulation
33%
Information Signal
33%