Abstract
In the experimental study of amorphous silicon films by H. Kumomi and T. Yonehara [J. Appl. Phys. 75, 2884 (1994)] the role of transient nucleation in formation of distribution of overcritical grains was emphasized. The corresponding analytical expression was previously obtained by V. Shneidman [Sov. Phys. Technol. Phys. 32, 76 (1987); 33, 1338 (1988)]. This solution is presented and its relation to the work of Kumomi and Yonehara is discussed.
Original language | English (US) |
---|---|
Pages (from-to) | 4811-4812 |
Number of pages | 2 |
Journal | Journal of Applied Physics |
Volume | 78 |
Issue number | 7 |
DOIs | |
State | Published - 1995 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy