In the experimental study of amorphous silicon films by H. Kumomi and T. Yonehara [J. Appl. Phys. 75, 2884 (1994)] the role of transient nucleation in formation of distribution of overcritical grains was emphasized. The corresponding analytical expression was previously obtained by V. Shneidman [Sov. Phys. Technol. Phys. 32, 76 (1987); 33, 1338 (1988)]. This solution is presented and its relation to the work of Kumomi and Yonehara is discussed.
|Original language||English (US)|
|Number of pages||2|
|Journal||Journal of Applied Physics|
|State||Published - Dec 1 1995|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)