Abstract
In the experimental study of amorphous silicon films by H. Kumomi and T. Yonehara [J. Appl. Phys. 75, 2884 (1994)] the role of transient nucleation in formation of distribution of overcritical grains was emphasized. The corresponding analytical expression was previously obtained by V. Shneidman [Sov. Phys. Technol. Phys. 32, 76 (1987); 33, 1338 (1988)]. This solution is presented and its relation to the work of Kumomi and Yonehara is discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4811-4812 |
| Number of pages | 2 |
| Journal | Journal of Applied Physics |
| Volume | 78 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1995 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
- General Physics and Astronomy
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