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Correlation between photoluminescence and surface species in porous silicon: Low-temperature annealing
L. Tsybeskov
, P. M. Fauchet
Research output
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Contribution to journal
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Article
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peer-review
113
Scopus citations
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Dive into the research topics of 'Correlation between photoluminescence and surface species in porous silicon: Low-temperature annealing'. Together they form a unique fingerprint.
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Keyphrases
Porous Silicon
100%
Photoluminescence
100%
Surface Species
100%
Low-temperature Annealing
100%
Si-H Bonds
66%
Fourier Transform Infrared Spectroscopy (FT-IR)
33%
Light-emitting
33%
Annealing
33%
Surface Morphology
33%
Photoluminescence Intensity
33%
Peak Wavelength
33%
Infrared Measurements
33%
Chemically Bonded
33%
Si-O Bond
33%
Hydrogen-rich
33%
Engineering
Low-Temperature
100%
Porous Silicon
100%
Emitting Light
50%
Fourier Transform
50%
Surface Morphology
50%
Initial Concentration
50%
Material Science
Photoluminescence
100%
Annealing
100%
Porous Silicon
100%
Surface Morphology
25%
Physics
Porous Silicon
100%
Photoluminescence
100%