Critical-voltage effects in electron-channeling patterns

Reginald C. Farrow, David C. Joy

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A linewidth minimum in the (220) electron-channeling-pattern (ECP) reflection in tungsten has been measured at 10.500.05 keV incident beam energy. This is interpreted as a second-order critical-voltage effect and is the first reported observation of such an effect in ECP's. The experimental critical voltage has been used to refine the tungsten (110) Fourier lattice-potential coefficient. The shape of the line-narrowing curve is used to estimate the depth of ECP information.

Original languageEnglish (US)
Pages (from-to)1590-1593
Number of pages4
JournalPhysical Review Letters
Volume44
Issue number24
DOIs
StatePublished - 1980

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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