Critical-voltage effects in electron-channeling patterns

Reginald C. Farrow; David C. Joy

doi:10.1103/PhysRevLett.44.1590

Critical-voltage effects in electron-channeling patterns

Reginald C. Farrow
, David C. Joy

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A linewidth minimum in the (220) electron-channeling-pattern (ECP) reflection in tungsten has been measured at 10.500.05 keV incident beam energy. This is interpreted as a second-order critical-voltage effect and is the first reported observation of such an effect in ECP's. The experimental critical voltage has been used to refine the tungsten (110) Fourier lattice-potential coefficient. The shape of the line-narrowing curve is used to estimate the depth of ECP information.

Original language	English (US)
Pages (from-to)	1590-1593
Number of pages	4
Journal	Physical Review Letters
Volume	44
Issue number	24
DOIs	https://doi.org/10.1103/PhysRevLett.44.1590
State	Published - 1980
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1103/PhysRevLett.44.1590

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title = "Critical-voltage effects in electron-channeling patterns",

abstract = "A linewidth minimum in the (220) electron-channeling-pattern (ECP) reflection in tungsten has been measured at 10.500.05 keV incident beam energy. This is interpreted as a second-order critical-voltage effect and is the first reported observation of such an effect in ECP's. The experimental critical voltage has been used to refine the tungsten (110) Fourier lattice-potential coefficient. The shape of the line-narrowing curve is used to estimate the depth of ECP information.",

author = "Farrow, \{Reginald C.\} and Joy, \{David C.\}",

year = "1980",

doi = "10.1103/PhysRevLett.44.1590",

language = "English (US)",

volume = "44",

pages = "1590--1593",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "24",

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T1 - Critical-voltage effects in electron-channeling patterns

AU - Farrow, Reginald C.

AU - Joy, David C.

PY - 1980

Y1 - 1980

N2 - A linewidth minimum in the (220) electron-channeling-pattern (ECP) reflection in tungsten has been measured at 10.500.05 keV incident beam energy. This is interpreted as a second-order critical-voltage effect and is the first reported observation of such an effect in ECP's. The experimental critical voltage has been used to refine the tungsten (110) Fourier lattice-potential coefficient. The shape of the line-narrowing curve is used to estimate the depth of ECP information.

AB - A linewidth minimum in the (220) electron-channeling-pattern (ECP) reflection in tungsten has been measured at 10.500.05 keV incident beam energy. This is interpreted as a second-order critical-voltage effect and is the first reported observation of such an effect in ECP's. The experimental critical voltage has been used to refine the tungsten (110) Fourier lattice-potential coefficient. The shape of the line-narrowing curve is used to estimate the depth of ECP information.

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UR - https://www.scopus.com/pages/publications/35949016820#tab=citedBy

U2 - 10.1103/PhysRevLett.44.1590

DO - 10.1103/PhysRevLett.44.1590

M3 - Article

AN - SCOPUS:35949016820

SN - 0031-9007

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SP - 1590

EP - 1593

JO - Physical Review Letters

JF - Physical Review Letters

IS - 24

ER -

Critical-voltage effects in electron-channeling patterns

Abstract

All Science Journal Classification (ASJC) codes

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