Defect identification algorithm for sequential and parallel computers

Ralf Hross, Sotirios Ziavras, Constantine N. Manikopoulos, Nitin J. Lad, Xi Li

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

This paper introduces sequential and parallel versions of an algorithm that compares original (reference) and processed images in the time and frequency domains. This comparison combined with histogram data from both domains can identify differences in the images. Extracted data is also compared to database data in an attempt to pinpoint specific changes, such as rotations, translations, defects, etc. The first application considered here is recognition of an object which has been translated and/or rotated. For illustration purposes, an original image of a computer-simulated centered needle is compared to a second image of the hypodermic needle in a different position.

Original languageEnglish (US)
Pages193-198
Number of pages6
StatePublished - Dec 1 1995
EventProceedings of the 1995 IEEE International Symposium on Industrial Electronics, ISIE'95. Part 1 (of 2) - Athens, Greece
Duration: Jul 10 1995Jul 14 1995

Other

OtherProceedings of the 1995 IEEE International Symposium on Industrial Electronics, ISIE'95. Part 1 (of 2)
CityAthens, Greece
Period7/10/957/14/95

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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