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Design for testability to combat delay faults
Jacob Savir
Electrical and Computer Engineering
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Dive into the research topics of 'Design for testability to combat delay faults'. Together they form a unique fingerprint.
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Keyphrases
AC Fault
33%
DC Fault
33%
Delay Faults
100%
Delay Test
33%
Design for Testability
100%
Distributed Self
33%
Fault Coverage
33%
Impact Performance
33%
Low Performance
33%
Operation Cost
33%
Proper Design
33%
Scan Design
33%
Self-delay
33%
Self-testing
33%
Shift Register
33%
Test Vector
33%
Engineering
Proper Design
33%
Shift Register
33%
Testability
100%