TY - GEN
T1 - Design of Deep-UV Nanowire LED with Al2O3 Quantum Dots and Step-Graded n-Type AlInGaN Electron Blocking Layer for High Quantum Efficiency
AU - Das, Samadrita
AU - Lenka, Trupti Ranjan
AU - Talukdar, Fazal Ahmed
AU - Nguyen, Hieu Pham Trung
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - In this paper, we have proposed a novel deep ultra-violet (DUV) AlGaN/GaN nanowire light-emitting diode (LED) with a step-graded n-type AlInGaN electron blocking layer (EBL) instead of a conventional p-type AlGaN EBL. The nanowire is designed with Al2O3 quantum dots (QDs) deposited all over the substrate. The proposed nanowire is designed for a ∼265 nm wavelength emission without affecting the hole injection efficiency. Due to enhanced carrier transport in the step-graded n-type EBL structure, there occurs reduced electron leakage into the p-region, superior hole activation and hole injection, improved output power and internal quantum efficiency (IQE). Moreover, this specially designed EBL reduces the quantum confined stark effect in the active region, ultimately enhancing the carrier wave functions overlap. The device structure is simulated using Atlas technology computer-aided design (TCAD). The efficiency is improved from ∼36.48% to ∼49.46% while switching from conventional p-type EBL to step-graded n-type EBL. Furthermore, our proposed structure exhibits 1.61% efficiency droop, which is significantly ∼4.8 times lower as compared to the regular structure.
AB - In this paper, we have proposed a novel deep ultra-violet (DUV) AlGaN/GaN nanowire light-emitting diode (LED) with a step-graded n-type AlInGaN electron blocking layer (EBL) instead of a conventional p-type AlGaN EBL. The nanowire is designed with Al2O3 quantum dots (QDs) deposited all over the substrate. The proposed nanowire is designed for a ∼265 nm wavelength emission without affecting the hole injection efficiency. Due to enhanced carrier transport in the step-graded n-type EBL structure, there occurs reduced electron leakage into the p-region, superior hole activation and hole injection, improved output power and internal quantum efficiency (IQE). Moreover, this specially designed EBL reduces the quantum confined stark effect in the active region, ultimately enhancing the carrier wave functions overlap. The device structure is simulated using Atlas technology computer-aided design (TCAD). The efficiency is improved from ∼36.48% to ∼49.46% while switching from conventional p-type EBL to step-graded n-type EBL. Furthermore, our proposed structure exhibits 1.61% efficiency droop, which is significantly ∼4.8 times lower as compared to the regular structure.
KW - Electron blocking layer (EBL)
KW - internal quantum efficiency (IQE)
KW - light-emitting diode (LED)
KW - multi-quantum well (MQW)
UR - http://www.scopus.com/inward/record.url?scp=85179515453&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85179515453&partnerID=8YFLogxK
U2 - 10.1109/IECON51785.2023.10312022
DO - 10.1109/IECON51785.2023.10312022
M3 - Conference contribution
AN - SCOPUS:85179515453
T3 - IECON Proceedings (Industrial Electronics Conference)
BT - IECON 2023 - 49th Annual Conference of the IEEE Industrial Electronics Society
PB - IEEE Computer Society
T2 - 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023
Y2 - 16 October 2023 through 19 October 2023
ER -