Detection of Single Intermittent Faults in Sequential Circuits

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Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits. This paper shows that the testing properties of intermittent faults insequential circuits can be studied by means of a probabilistic automaton. The evaluation and derivation of optimal intermittent fault detection experiments in sequential circuits is done by creating a product state table from the faulty and fault-free versions of the circuit under test. Both deterministic and random test procedures are discussed. The underlying optimality criterion maximizes the probability of fault detection.

Original languageEnglish (US)
Pages (from-to)673-678
Number of pages6
JournalIEEE Transactions on Computers
Issue number7
StatePublished - Jul 1980
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics


  • Error latency
  • Markov chain
  • deterministic and random testing
  • input probability
  • intermittent fault
  • sequential circuit
  • state table


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