Determination of the internal series resistance of CIS and CIGS photovoltaic cell structures

Alan E. Delahoy, Adam M. Payne

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

Abstract

A new method is described to determine the internal series resistance of thin film solar cells. The method involves illumination of a small area of the cell with light sufficiently intense to make the internal resistance easily observable. For the CIS and CIGS cells examined, specific internal resistances ranging between 7 × 10-2 and 3 × 10-4 Ω cm2 were obtained. Such remarkably low values confirm the ability of CIGS to function as a concentrator cell.

Original languageEnglish (US)
Pages (from-to)841-844
Number of pages4
JournalConference Record of the IEEE Photovoltaic Specialists Conference
DOIs
StatePublished - Jan 1 1996
EventProceedings of the 1996 25th IEEE Photovoltaic Specialists Conference - Washington, DC, USA
Duration: May 13 1996May 17 1996

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Determination of the internal series resistance of CIS and CIGS photovoltaic cell structures'. Together they form a unique fingerprint.

Cite this